Bruker AXS - XMA

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TXRF spectrometers

Total Reflection X-ray Fluorescence

Elemental analysis of traces down to the sub-ppb level

Micro-XRF spectrometers

Micro X-ray Fluorescence

Elemental analysis (Na-U) of inhomogeneous or irregularly shaped samples

Contact Customer Support

For technical service, purchasing consumables, service visits, contracts and training, please contact our X-ray Diffraction, 3D X-ray Microscopes and Elemental Analyzers customer support centers.

Or alternatively create a Service Request