Languages

Free PDF Download | Full-Length Access

FilmTek 4000 Brochure 

Learn more about our non-destructive optical property and thickness measurement tool for silicon photonics, photonic integrated circuits, and planar waveguides
Input value is invalid.
Please enter your first name
Please enter your last name
Please enter your e-mail address
Please enter a valid phone number
Please enter your Company/Institution
What best describes your current interest?
Please add me to your email subscription list so I can receive webinar invitations, product announcements and events near me.
Please accept the Terms and Conditions

             Privacy Notice   Terms of Use

    

  • Learn about FilmTek 4000 key features and capabilities and how this system addresses the demanding process control needs of silicon photonics, photonic integrated circuits, and planar waveguides.
  • Learn about the patented technology and specialized design that enable the FilmTek 4000 system to provide exceptional measurement of film thickness and optical properties.
  • See system specs and example measurement results.

 

 

* Please fill out the mandatory fields.

Note: You will be directed to the download page after form submission; page may refresh.

Thank you. Your download is ready.

       

 

If you have any questions about the FilmTek 4000 system or any of our products or services, please contact us.
You can also email us for more information at productinfo@bruker.com.

If you would like to connect with a Bruker representative immediately, contact our regional offices at:

Asia: +65 6540 4388
China: +86 10 5833 3000
Europe: +33 172 86 61 00
Japan: +81 3 3523-6361
North America: +1 805-967-1400