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▶ WATCH ON-DEMAND | 19 MINUTES

Surface Characterization of Semiconductor Materials and Devices

Learn everything about stylus profilometry for semiconductor applications, from fundamentals to a real-time demonstration
Watch Now | 10 Minutes

Leveraging stylus profilometry for semiconductor research and manufacturing 

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Presented by Sandip Basu, Ph.D., Application Scientist, Bruker (July 7, 2021)

PRESENTATION HIGHLIGHTS:

  • [00:00:00] Introduction to stylus profilometry
  • [00:01:27] Stylus profilometry main capabilities
  • [00:03:31] Solution for step height & thin films
  • [00:04:50] Solution for bow & thin film stress
  • [00:05:57] Semiconductor and microelectronics applications
  • [00:06:49] Vision64 software demonstration
Watch Now | 9 Minutes

Stylus profiling for high vertical resolution and long-range flatness measurements 

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Presented by Samuel Lesko, Ph.D., Technology and Applications Development Director, Bruker; and Michael Febvre, Ph.D., Application Manager, Bruker EMEA (April 21, 2021)

       PRESENTATION HIGHLIGHTS:

  • [00:00:00] Step Height and Thin Film
  • [00:02:17] Bow and Thin Film Stress
  • [00:04:13] DektakXT demonstration

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