XFlash® FlatQUAD 2L: Step Into The Future of SEM Elemental Analysis
Tuesday, 22 September 2026
Session I: 10:00 CEST (Berlin), 16:00 SGT (Singapore), 17:00 JST (Tokyo)
Session II: 11:00 EDT (New York), 12:00 BRT (São Paulo), 17:00 CEST (Berlin)
Both sessions cover the same content.
Meet FlatQUAD 2L: Maximized Collection Efficiency with Simulaneous BSE Imaging
Join us to discover the new XFlash® FlatQUAD 2L EDS detector.
XFlash® FlatQUAD™ 2L, Bruker’s breakthrough EDS detector that uniquely combines industry-leading X-ray collection efficiency with simultaneous BSE imaging. Leveraging an innovative annular four-segment SDD design positioned between the SEM pole piece and sample, FlatQUAD 2L enables perfectly co-registered compositional and contrast information in a single acquisition.
In this webinar, discover how simultaneous EDS and BSE data collection accelerates workflows, reduces electron dose on beam-sensitive materials, and delivers deeper insights into complex structures. Learn how this unique technology opens new opportunities for the characterization of semiconductors, battery materials, nanoparticles, biological specimens, FIB lamellae, and other advanced materials requiring high-resolution correlative analysis.
Be among the first to experience the future of SEM analytics with the XFlash® FlatQUAD™ 2L.
Speakers
Andi Kaeppel
Sr. Product Manager EDS on SEM, Bruker Electron Microscope Analyzers
Dr. Purvesh Soni
Sr. Applications Scientist EDS, Bruker Electron Microscope Analyzers