This thirty page introductory e-book provides a comprehensive guide to atomic force microscopy. Topics discussed range from its fundamental working principles and advantages versus other techniques, to practical considerations for AFM operators and case study examples.
Readers can expect to:
- Learn what atomic force microscopy is and how its materials characterization capabilities — including fast imaging, a large selection of modes, and quantitative surface characterization — enable a broader range of research.
- Understand the workings of a typical atomic force microscope, including important primary and secondary imaging modes.
- Gain technical and practical knowledge about navigating some of the most common challenges of studying inorganic materials, including preparing samples for AFM scanning and selecting the right tip.