Offices

Israel - Migdal Haemek

Supporting the countries: Israel

Sales

Postal address

Bruker Technologies, Ltd.
Zone #6, Ramat Gavriel
Industrial Zone
Migdal Ha'Emek 23100, Israel

clean-bare-wafers-teaser

X-Ray Defect Inspection

Bruker defect detection systems detect crystalline defects, such as cracks, slip, dislocations, and micropipes on single-crystal substrates

close-up-of-patterned-wafer-teaser

X-Ray Metrology for Compound Semi

Diverse x-ray metrology systems deliver high-quality QC monitoring and detailed R&D analysis of epi-layer films

Silicon-patterned-wafer-teaser

X-Ray Metrology for Silicon Semi

Non-destructive x-ray metrology solutions for thin-films identifying substrate defects and performing front end of line control of epi films and high-k dielectrics, as well as analyzing metal films and wafer-level packaging bumps