Application Training

X-Ray Reflectometry and Grazing Incidence Diffraction (W/Th)

This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD.

Date:

  • August 10 - 11, 2022
  • November 2 - 3, 2022

Time:

  • 9am-4pm CT

Further Information

Location

Language

English

Class size

Because our trainings are interactive and learner-oriented, we limit class size to a maximum of four participants. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. We reserve the right to cancel a course and will notify participants four weeks prior to the start date if the course is cancelled.

 

Attendance fee

The course fee is $1,870 USD per attendee per two-day session.

Contact

For further information about the course content, please contact:

Ben Krueger
Applications Scientist, XRD

For information about price, registration, or other questions:

Melanie Swanson
Marketing Specialist

For a quotation, please contact: