Application Training

X-Ray Reflectometry and Grazing Incidence Diffraction

This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD.

This class will be scheduled on request.

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Further Information




Class size

Because our trainings are interactive and learner-oriented, we limit class size to a maximum of six participants. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. We reserve the right to cancel a course and will notify participants four weeks prior to the start date if the course is cancelled.


Attendance fee

The course fee is $1,870 USD per attendee per two-day session.


For further information about the course content, please contact:

Ben Krueger
Applications Scientist, XRD

For information about price, registration, or other questions:

Melanie Swanson
Marketing Specialist

For a quotation, please contact: