Application Training

X-Ray Reflectometry and Grazing Incidence Diffraction (W/Th)

This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Power Diffraction or High Resolution Diffraction course.

Date:

August 25-26,  2021

Time:

9am-4pm CT

Details:

Location:

Further Information

Location

Language

English

Class size

Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis.

 

Attendance fee

The course fee is $1,700 USD per attendee per two-day session.

Contact

For further information about the course content, please contact:

Ben Krueger
Applications Scientist, XRD

For information about price, registration, or other questions:

Caitlin Heitman
Marketing Specialist

For a quotation, please contact: