This training course will show the different methods used for X-ray reflectometry (XRR) and grazing incidence diffraction (GID) measurement and analysis, including the DIFFRAC.EVA and DIFFRAC.XRR software packages. The course is intended for users with experience in XRD, new users are strongly encouraged to first attend the X-ray Power Diffraction or High Resolution Diffraction course.
No dates scheduled
Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis.
The course fee is $1,700 USD per attendee per two-day session.
For further information about the course content, please contact:
Applications Scientist, XRD
For information about price, registration, or other questions:
For a quotation, please contact: