Advancing Industrial Metrology Automation with Bruker's Dimension AFMs
Evolving AFM Automation for Industrial Metrology
Automated AFM metrology plays a central role in meeting yield and precision requirements in advanced manufacturing.
This webinar will explore how Dimension AFM platforms support increasing levels of automation, from scripted measurements to data-driven control. The presenters will outline practical approaches that align automation capabilities with real metrology needs.
Join us for this webinar to learn about:
- Programmed multi-site AFM measurements for efficient data collection
- Recipe-based automation using graphical, zero-programming tools
- Python-enabled interfaces for real-time control and data integration
Wednesday, May 13 – 8AM PDT | 11AM EDT | 5PM CEST
Webinar Summary
As semiconductor manufacturing demands higher yields and nanometer-scale precision, automated AFM metrology has become an industry standard. This webinar explores how the Bruker Dimension AFM platforms drive this transition through a multi-tiered software evolution, moving from basic automation to AI-powered intelligence.
We will cover three key levels of automation for metrology applications in semiconductors and other industries:
- The fundamental Programmed Move for high-efficiency, multi-site automated measurements.
- Bruker’s widely adopted AutoMET software, which utilizes a graphical, "zero-programming" recipe creator to reduce operational barriers and enhance measurement repeatability.
- A new Python-based real-time control interface. Built on the Microsoft COM standard, this interface enables seamless integration between AFM hardware and modern data science environments, opening new possibilities for AI-driven defect recognition and closed-loop control.
Find out more about the technology featured in this webinar or our other solutions for atomic force microscopy:
