Chip

FT-IR Surface Analysis Techniques (part II)

In the first part of our webinar with the topic “Surface Analysis Techniques”, which took place at the end of April, we introduced mainly the most widely used FT-IR surface measurement methods: attenuated total reflection (ATR), specular reflectance, infrared reflection absorption spectroscopy (IRRAS) on metal and diffuse reflection infrared Fourier transform spectroscopy (DRIFT).
This webinar took place on June 16th 2020

Register to download slides & media

Free R&D Webinar “Surface Analysis Techniques II”

Now we would like to complete this topic and announce the second part of this online course. In this part we will present you further surface analysis techniques and show you dedicated high-end application examples:

  • PMIRRAS for thin film measurement on metal surface
  • IRRAS on non-metallic surface
  • (PM)IRRAS solutions in dedicated high-end applications
  • Surface emission experiment
  • Photo acoustic spectroscopy

 

Language: English

Duration: 60 min (incl. discussion)