AN MIC411 EN

Defect Analysis using FT-IR Microscopy

Microscopic techniques are suitable for locating and analyzing defects as small as a few millimeters or even micrometers for many different types of products. Fourier-Transform infrared (FT-IR) microscopy is capable of revealing the chemical composition of such failures with a high spatial resolution.

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Please download the Application Note "Defect Analysis using FTIR Microscopy" in English here.