Experience our Breakthrough Electron Microscope Detectors

Powered by Bruker's innovative WARP sensor technology, eWARP TKD is a dedicated on-axis Transmission Kikuchi Diffraction detector designed for nanomaterials characterization in the SEM.

Featuring a newly developed pixelated sensor with 162 × 162 pixels and an active area exceeding 26 × 26 mm², eWARP TKD combines exceptional sensitivity with ultra-fast acquisition speeds of up to 5,700 fps.

With better than 2 nm spatial resolution, integrated Dark Field and Bright Field imaging, and an on-axis geometry, eWARP TKD redefines what is possible in TKD analysis.

• Characterize nanomaterials with spatial resolutions better than 2 nm.

• Acquire high-quality orientation and phase maps in 1–5 minutes at speeds of up to 5,700 fps.

• Capture real-time microstructural evolution during in-situ heating and mechanical testing.

• Perform low-dose TKD analysis on beam-sensitive and delicate materials.

• Minimize drift-induced artifacts through ultra-fast mapping and reduced acquisition times.

• Collect Bright Field and Dark Field images simultaneously alongside TKD data.

Featuring four silicon drift detector (SDD) segments with 100mm² area arranged around a central aperture, XFlash^® FlatQUAD 2L combines exceptional X-ray collection efficiency with true parallel EDS and BSE acquisition. 

With solid angles exceeding 1 sr, count rates up to 8 million cps ICR (input count rate), 4 million cps OCR (output count rate) and energy resolution down to 127 eV at Mn Kα:  XFlash^® FlatQUAD 2L is designed to support both routine analysis and challenging applications.

• Perform SEM EDS at ultra-high spatial resolution, enabling analysis of nanostructured materials and semiconductor devices.

• Quantify elemental compositions at high throughput with exceptional count rates and collection efficiency.

• Overlay X-ray EDS data with true parallel BSE images for correlated chemical and compositional information.

• Analyze delicate, beam-sensitive, or charging samples with low kV, low beam currents, low vacuum conditions.
  

• Accurately map the elemental composition of rough and topographic samples where conventional detector geometries are limiting.

• Perform TEM-like EDS analysis using a SEM, enabling elemental characterization of electron-transparent specimens using STEM-in-SEM workflows.

Bruker will be attending the following shows with live demos. 

• M&M: Microscopy & Microanalysis - 2^nd to 6^th August - Milkaukee, WI, USA. 
• IMC: The International Microscopy Congress - 31^st August to 4^th September - Liverpool, UK.

Get in touch with your local Bruker representative to book a demo now.