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Atomic Force Microscopy for Materials E-Book Download

Learn about the fundamental elements and advantages of AFM-based material characterization and how Bruker's AFM technology provides faster imaging and a larger selection of modes.

Submit the form to gain instant full-length access to chapters on:

The history, advantages, and constraints of atomic force microscopy (AFM), particularly for surface characterization of material samples.
The standard components, primary AFM imaging modes, and main secondary modes of contemporary AFM systems.
How to operate a typical AFM instrument, including sample preparation and tip selection.
How to leverage advances in AFM technology to navigate the challenges of studying inorganic materials.
Case studies of practical applications of AFM in industry-leading materials research.

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