3D Optical Profilers

Knowledge Pack: 3D Surface Measurement

Get instant, all-in-one access to our most popular resources exploring the capabilities, advantages, and practical considerations for 3D surface measurement using white light interferometry (WLI)-based techniques.


This knowledge pack includes:

- 3 full-length application notes

- 2 full-length webinar recordings

- 1 real-time technical demo

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Comparing 3D Optical Techniques for Metrology Applications

RESOURCE TYPE: Application Note [PDF]
5 pages

This application note compares the 3D surface measurement capabilities and performance of WLI-based optical profilometry vs. confocal microscopy techniques.

Topics covered include:

  • The advantages and limitations of these techniques in both common and specialized surface measurement applications.
  • Practical considerations for selecting a method for measuring both surface topography and the size and shape of microscopic surface features.

Advantages of Measuring Surface Roughness with White Light Interferometry

RESOURCE TYPE: Application Note [PDF]
7 pages

This application note explores the high-precision mean roughness measurement capabilities of WLI-based optical profilers. Topics discussed include normative standards requirements, key technical reasons for choosing WLI methods, and the advantages and areas of applicability of its full areal measurement capabilities.

Example data is included demonstrating how WLI-based tools are able to maintain extremely precise vertical measurement — even on steady, rough slopes and at sub-micron lateral resolution — to achieve perfect correlation with certified roughness standard values. 

Characterizing Surface Quality: Why Average Roughness (Ra) is Not Enough

RESOURCE TYPE: Application Note [PDF]
6 pages

This application note explores the use of 3D parameters to characterize surface finish and performance. In it, Bruker experts explain the value and uses of various R and S parameters, then present two real-world case studies in which these 3D parameters were used for the design and development of high-performance surfaces. Contents include:

  • Figures, tables, and detailed explanations clarifying and comparing the value and potential uses of different R and S parameters.
  • Two case studies showing the advantages of using S parameters for surface evaluation and design.
  • A collection of relevant standards with definitions and usage guidelines for surface parameters. 

An Overview of Surface Roughness Measurements: Choice of Technique and Analysis

RESOURCE TYPE: Webinar Recording
1 hour

This webinar focuses on answering the question "What are the methods for surface roughness measurement?" and focuses on surface roughness measurements and analysis using two widely-employed methods — (1) contact methods using a stylus profilometer and (2) non-contact methods using a 3D optical profiler based on optical interferometric principles. This includes exploration of the most commonly asked questions about distinction/overlap in the line profile vs. areal roughness analysis.

Watch this webinar to gain new insight into:

  • How to select the best instrument and assessment method for your application.
  • Answers to the most commonly asked questions about line profile vs. areal roughness analysis.
  • Best practices and key considerations for researchers.

Measuring Profile and Real Mean Roughness with 3D WLI Profilers

RESOURCE TYPE: Webinar Recording
1 hour

This webinar focuses on the practical impacts and differences between stylus and areal methods of assessing mean roughness (Ra), as well as the key considerations necessary for determining the most appropriate applications for either method.

Topics discussed include

  • The theoretical background of roughness measurement.
  • Practical measurement considerations (including filter selection, measurement setup, and data processing) for measuring profile and real mean roughness.
  • Using Bruker's Stylus and Optical profilometry solutions, highlighting the ways that both profile and areal methods are able to co-exist in modern industry.

Demo: Floorstanding Full System - NPFLEX

RESOURCE TYPE: Real-time technical demonstration
10 minutes

In this demonstration, Bruker experts demonstrate the use of WLI-based optical profilometry for characterizing the surface roughness of an orthopedic implant. The demonstration includes both a close-up, real-time view of the instrument in use and real-time data collection, analysis, and interpretation using our Vision64 Map software.