High Resolution Diffraction
This training course will show the theoretical fundamentals and data collection strategies for high resolution X-ray diffraction with the D8 family of diffractometers. The main focus is on the analysis of epitaxial thin films using the DIFFRAC.SUITE software packages including DIFFRAC.LEPTOS H.
This class will be scheduled on request.
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Further Information
Location
Language
English
Class size
Because our trainings are interactive and learner-oriented, we limit class size to a maximum of six participants. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. We reserve the right to cancel a course and will notify participants four weeks prior to the start date if the course is cancelled.
*Each participant will be provided with class materials and lunch daily.
Attendance fee
The course fee is $1,870 USD per attendee per two-day session.
Contact
For further information about the course content, please contact:
Ben Krueger
Applications Scientist, XRD
For information about price, registration, or other questions:
Melanie Swanson
Marketing Specialist
For a quotation, please contact: