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AFM Electrical Measurements Course

May 24-25, 2018 | San Jose, CA

Thursday - Friday, May 24 - 25, 2018
San Jose, CA

DAY 1 | Kelvin Probe Force Microscopy

DAY 2 | SCM & TUNA

Course Objectives

This class is focused on material’s electrical property measurements using AFM.

Three popular AFM electrical techniques will be discussed: Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), and Tunneling Current AFM (TUNA). KPFM measures material work function as well as surface charge. SCM is one of the primary techniques for doping profile mapping in semiconductor industry. TUNA can measure material’s electrical conductivity with wide range of current from fA-uA.

This class includes both theory sessions and lab sessions. In the lab sessions, students can practice each technique on Bruker AFMs. Students are welcome to bring their own sample to practice.

Register

Register Here

Cost:

$1,000/person* 
Daily lunch is included.
Individuals are responsible for their own transportation and lodging.

* One free seat for platinum service contract customers. Bruker also offers a 20% discount to actively enrolled students, extended warranty customers, or second seat of platinum service contract customers.