AFM Electrical Measurements Course

June 13-14, 2019 | San Jose, CA

DAY 1 | Kelvin Probe Force Microscopy


Course Objectives

This class is focused on material’s electrical property measurements using AFM.

Three popular AFM electrical techniques will be discussed: Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM) and Tunneling Current AFM (TUNA). KPFM measures material work function as well as surface charge. SCM is one of the primary techniques for doping profile mapping in the semiconductor industry. TUNA can measure material’s electrical conductivity with a wide range of current from fA-uA.

This class includes both theory sessions and lab sessions. In the lab sessions, students can practice each technique on a Bruker AFM. Students are welcome to bring their own sample to practice.


Register Here


Daily lunch is included.
Individuals are responsible for their own transportation and lodging.

*Two free seats for premium care service contract customers and one free seat for standard care service contract customers. Bruker also offers a 20% discount to actively enrolled students or additional seats for service contract customers.