Innovative nanoelectrical AFM modes provide a significant new capability for materials characterization

AFM has been used for decades to not only image a material, but to also measure their nanoelectrical properties. AFM instruments can be used on a wide range of materials, however recent advancements in AFM technologies has allowed for more information to be obtained simultaneously providing a more complete material analysis.

Webinar Overview

The webinar looks at how AFM-based nanoelectrical measurement capability has advanced, how it is now more accessible to a wider range of materials and how the user can obtain a greater amount of information about their sample than has previously been possible. The properties which can be measured by current AFM instruments are compared to Bruker’s new state-of-the-art solution. 

The webinar showcases how correlating nanomechanical and nanoelectrical measurements can lead to a greater determination of properties. It shows how Bruker’s new solution, the NanoElectrical Lab, can correlate both the mechanical and electrical data at each single pixel for an increased understanding of sample properties and an increase in the longevity of AFM tips.

Key Topics

The NanoElectrical Lab:

  • Introduction to the NEW DataCube modes 
  • Correlation of nanomechanical and nanoelectrical data
  • Possibilities for tailored nanoelectrical measurements

 

Applications:

  • Graphene and other 2D materials
  • Semiconductors
  • Nanowires
  • Ferro and piezo-electrics
  • Smart materials
  • Conductive polymers
  • Battery materials
  • Fuel Cells
Peter DeWolf

About the Presenter

Peter De Wolf graduated from The University of Ghent with a degree in Electrical Engineering and followed this with a PhD from KU Leuven University. Since then, Peter has been authored on 47 academic publications focused around microscopy techniques. He is now the Application Director for Nano Surfaces Business at Bruker.

Who Should Watch?

Overall, this webinar is tailored to those who already undertake electrical measurements, or are interested in it, as well as people who are already using existing techniques but require a higher resolution. In addition, it is of interest to people who already use AFM but not necessarily for nanoelectrical measurements. General microscopists who are interested in measuring properties at the nanometer scale would also be interested in this webinar.