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Profiler Webinars

An Open and Free Resource for Optical Profiler, Stylus Profiler and Confocal Microscope Owners and Users

Our optical and stylus webinars are available on our YouTube channel — www.youtube.com/BrukerNanoSurfaces. The links below will take you to the respective recording online. No registration is needed to watch a prior webinar. Sign up for email notifications about Bruker's upcoming webinars.

 

Recent Events

Webinar Content
Advancements in Optical Profiler Technology - from Wyko NT to Contour Elite

March 2017

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Please join us to discuss the technological advances in the Bruker Contour Optical Profiler product line over past optical profilers. The webinar will begin with the basic measurement theory of Optical Profilers, which is based on White Light Interferometer or also known as Coherence Scanning Interferometry. These profilers allow fast and very accurate surface topography measurements over large areas. The improvements in hardware and software will also be presented, along with advancements in additional measurement modes and hardware options. Some of these software improvements include measurement of thin films, versatile and powerful automation, and combined measurement modes for large Z measurement heights with angstrom resolution. Some of the hardware improvements include LED light and color camera imaging. The various Contour product offerings will also be presented along with the differences between each model.
Hear from one of our senior applications engineers about how the systems are being used in real-world applications today.

Recent Webinars

Webinar Content
Jun 29, 2016

More than just Roughness: An Introduction to Non Destructive 3D Surface Texture Studies
Manufacturers require surface finish parameters capable of specifying and quantifying their desired surface finish characteristics; to enable reproducibility of these critical surfaces within the specifications that perform to their intended functions reliably and efficiently.

Bruker understands your needs to provide non-contact surface texture measurement for a range of surfaces and materials. Thus in this webinar, we will present the following with case studies - (A) 3D surface measurement techniques based on white light interferometry – (B) The power of 3D related parameters surface characterization compared to 2D – (C) Surface finish characterization
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May 17, 2016

Measuring Transparent Films with Bruker Optical Profilers
In this webinar we demonstrate how to measure transparent film thickness and surface/subsurface topography. These measurements allow fast, non-contact characterization of films such as photoresists, oxide layers, and protective coatings. The underlying theory will be explained, as well as guidelines for optimizing measurements and processing the collected data. Requires the optional “Films” package for Vision64.
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February 24, 2016

Inspection for Texture and Lead in Dynamic Sealing Systems
The successful performance of dynamic sealing relies on proper materials and consistent processes for parts production. In order to meet functional performance and lifetime requirements, each component in such systems must be made precisely and properly from reliable, durable materials. Specifically, the materials, geometry and surface conditioning of the journal shaft surfaces can play a key role in the functional performance of dynamic sealing. Due to the range of acceptable use conditions and stringent environmental and performance metrics, accurate metrology can contribute heavily to successful production of functional sealing surfaces.
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July 30, 2015

Non-contact Surface Texture Metrology for Industrial Applications
In this webinar, we will discuss the capability of 3D optical microscopes (based on white light interferometry) to provide fast, non-contact surface texture measurement for a range of surfaces and materials.
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May 28, 2015

High-Fidelity Imaging and Metrology Combined – A Clearer Look at Engineered Surfaces
Physical appearance, texture and color can be important characteristics influencing scientific research and analysis of engineered surfaces. Accurate depiction and measurement of these qualities help metrologists, engineers and researchers study and understand their materials; and clearly communicate their results. A new solution from Bruker provides high quality 3D surface topography data and high quality imaging in fine detail to expedite answers when problems arise on the manufacturing floor or in characterization labs, alike.

In this webinar, we will explore how high-fidelity imaging, combined with traditional metrology (such as height, width, depth and texture) provides the investigator with a complete story. Our discussion will highlight a new capability for Bruker’s 3D Optical Microscopes that combines fast, non-contact surface metrology with enhanced imaging to show the true nature of surfaces under test. This capability will be of benefit to users across a wide range of applications with both imaging and metrology needs.
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March 18, 2015

New Product Technology Introduction
How to simultaneously measure form & surface finish of parts up 10cm diameter sphere in size (In English)
Watch the recording (only for registrants) or contact us to watch the recording

Sept 24, 2014

Large Substrate Stylus Profiler Automation and Ease of Use
Bruker recently launched a new product, Dektak XTL, to specifically address these rising demands. Dektak XTL's key applications include metrology of surface roughness, film thickness and etch feature step height dimensions, wafer bow and stress, panel feature dimensions, among others which are keys to enabling wafer and panel production monitoring any time gage capable metrology is required for production.
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Aug 27, 2014

The Connection between Surface Texture and Sliding Friction
Join us as we discuss the relationship between surface textures and friction of moving parts using 3D optical microscopes. This month's 3D Optical Webinar features guest speaker, Don Cohen, Ph.D. from Michigan Metrology LLC.
In this webinar we delve in detail into the interactions of mating component parts and sliding friction. We discuss the quanitification of surface textures and see how these analyses can be applied to optimize sliding frictional interfaces.
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July 30, 2014

Surface Measurement 101: Corrosion and Wear Monitoring
In this webinar, we will describe the use of 3D optical microscopes and white light interferometry (WLI) to achieve fast and accurate measurement of corrosion on metal coupons, as well as characterization of material loss in wear experiments. We will share experimental results from measurements taken for corrosion monitoring, identification of corrosion pits, and results correlating to gravimetric techniques for induced wear metrology.
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June 26, 2014

Surface Measurement 101 - Non-contact 3D Optical Metrology
Join us as we discuss the fundamentals of non-contact surface metrology using 3D optical microscopes. Dr. Joanna Schmit, a leader in interferometry science, will review the theory and application of 3D optical microscopy and interferometry during this one-hour event, extending to you her knowledge and experience.
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May 28, 2014

Mobility and Miniaturization: 3D Optical Microscopes Address Key Semiconductor Metrology Needs
In this webinar, we present information on how 3D microscopes based on white light interferometry can address some of the development and production metrology challenges that device manufacturers face. 3D WLI microscopes are able to address needs in both production and product development, as well as provide high-quality imaging for failure analysis.
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April 30, 2014

Electro- luminescence - Comprehensive Characterization of HB-LED Epi Wafers
The LumiMap makes use of nondestructive touch probes that allow a controlled current to flow through the wafer. This current excites the active layer of the epi causing it to emit light. Forward voltage, reverse current, intensity, wave length, spectral width and quantum efficiency data are quickly and accurately collected. Such a nondestructive approach eliminates the need for indium dot, acid clean, and quick-fab processes. This accurate approach reduces fab costs by improving yield, reducing scrap and improving cycle time. It also has been shown that LumiMap data can correlate to device-level performance, providing an early warning for process drift
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March 27, 2014

Tribo-testing Applications in Automotive and Effective Characterization of the Tribo-tests
Going green is the theme for Automotive these days. Higher efficiency, longer lasting and burning less fuel are concepts explored throughout the world. There is a steady increase in demand for better materials to be used in applications such as scratch-resistant, self-healing coatings, machining, bearings, gears and metal forming where friction, wear and lubrication play an important role.
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March 26, 2014

High-Volume Inspection of Multi-Chip Module and High-Density Interconnect PCB Substrates
In this webinar, we will introduce some key metrology inspection capabilities being deployed today for feature measurements specific to high-volume manufacturing of MCM, high-density interconnect PCB substrates. These substrates are a very important part of the technology enabling production of the mobile and portable processing power needed for the ubiquity of tablets, e-readers, phones and other devices on the market, meeting the demands of the modern world. There is a high level of automation in the manufacturing of these substrates, and the metrology requirements are higher than conventional, commercial PCB manufacturing substrates due to the smaller features required that are driving and to meet the product functional needs.
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Feb 26, 2014

Corrosion and Wear Monitoring: Fast and Accurate Metrology with 3D Optical Microscopes Based on White Light Interferometry (WLI)
In this webinar, we will describe the use of 3D optical microscopes and white light interferometry (WLI) to achieve fast and accurate measurement of corrosion on metal coupons, as well as characterization of material loss in wear experiments. We will share experimental results from measurements taken for corrosion monitoring, identification of corrosion pits, and results correlating to gravimetric techniques for induced wear metrology.
Download the presentation
Watch the recording

Jan 23, 2014

Large Substrate Stylus Profiler Automation and Ease of Use: Dektak XTL Delivers!
Quality assurance/quality control (QA/QC) production monitoring in industries such as semiconductor and display panel manufacturing are becoming a more important part of production. This is attributed to the need for smaller, faster and more compact products with increased functionality and capability. This forces manufacturers to produce a more accurate and higher yield in order to meet the demands of their customers and successful ROI.
Bruker recently launched a new stylus profiling system, Dektak XTL, to specifically address these rising demands. Dektak XTL's key applications include metrology of surface roughness, film thickness and etch feature step height dimensions, wafer bow and stress, panel feature dimensions, among others which are keys to enabling wafer and panel production monitoring any time gage capable metrology is required for production.
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Webinar Archive

Webinar Content
Nov 21, 2013

Discover 3D measurements for flexible electronics: a metrology masterclass
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Nov 8, 2013

Bruker Stylus and 3D Microscope Solutions for Semiconductor and Printed Circuit Board Applications
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Oct 31, 2013

Straight Talk: Laser Scanning Confocal and Coherence Scanning Interferometric 3D Microscope Capabilities
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Sep 25, 2013

Bruker Stylus and 3D Microscope Solutions for Semiconductor Applications
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Aug 28, 2013

What's New? ContourGT - 3D Optical Microscopes and Vision64
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Jul 26, 2013

The Connection between Surface Texture and Sliding Friction
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Jun 24, 2013

An Introduction to Non-contact Surface Measurement
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May 8, 2013

Combined NanoLens AFM and 3D Optical Microscope Inspection
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Apr 4, 2013

Improving Yields: 3D Static and Dynamic MEMS Characterization
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Feb 27, 2013

Dispelling the Myths – The truth about 3D optical imaging and metrology
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Jan 30, 2013

Metrology for Semiconductor Process Control
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Dec 11, 2012

3D-Oberflächenmesstechnik für die Produktion (German)
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Oct 10, 2012

Production Ready 3D Surface Metrology
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Sept 5, 2012

Time to Data: Keys to Fast, Accurate Surface Metrology
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Aug 8, 2012

Cu Wire Bonding Process Monitoring
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Jun 19, 2012

Understanding the Capabilities of Your Surface Measurement System
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May 30, 2012

Surface Corrosion and Wear Studies
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Apr 24, 2012

ISO vs. ASME: The Basics of Surface Profile Filtering
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Mar 28, 2012

Time-to-Data – Keys to Fast, Accurate Metrology
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Feb 28, 2012

Obtaining Accurate Surface Measurements
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Jan 25, 2012

How to Achieve the Resolution You Need
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Sep 20, 2011

Advances in High-Brightness LED Metrology Capabilities for R&D and Production Inspection
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Jul 19, 2011

Precision Metrology for Enhanced Solar Efficiency
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Jun 14, 2011

Extending Lateral Resolution of Optical Profiling Beyond the Optical Diffraction Limit
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May 10, 2011

Recent Advances in Stylus Profiler Technology
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Nov 10, 2010

Enhancing LED yield via Comprehensive Surface Metrology
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