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Japan - Tokyo

Atomic Force Microscopy, Nanomechanical Test Instruments, Optical Profilometry, X-ray Fluorescence, Ellipsometry & Reflectometry, Mechanical Testing & Tribology, Fluorescence Microscopy

Supporting the countries: Japan
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Postal address

Bruker Japan K.K. Nano-surface Division
1-4-1, Shinkawa
Chuo-ku,
Tokyo, 104-0033, Japan