Bruker
产品与解决方案 应用 服务与支持 新闻和活动 关于我们 职业
请至少输入2个字符 (您当前输入的是1个字符) 。

Languages

  • Deutsch
  • English
  • Español
  • Français
  • Italiano
  • Polski
  • Português
  • Русский
  • 中文
  • 日本語
  • 한국어
Offices

Israel - Migdal Haemek

X-Ray Metrology

Supporting the countries: Israel
  • +972 4 654 3666
  • productinfo@bruker.com
  • +972 4 654 7472
Sales
  • +972 4 654 3666
  • productinfo@bruker.com
  • +972 4 654 7472
Postal address

Bruker Technologies, Ltd.
Zone #6, Ramat Gavriel
Industrial Zone
Migdal Ha'Emek 23100, Israel

clean-bare-wafers-teaser

X-Ray Defect Inspection

Bruker defect detection systems detect crystalline defects, such as cracks, slip, dislocations, and micropipes on single-crystal substrates
阅读更多
close-up-of-patterned-wafer-teaser

X-Ray Metrology for Compound Semi

Diverse x-ray metrology systems deliver high-quality QC monitoring and detailed R&D analysis of epi-layer films
阅读更多
Silicon-patterned-wafer-teaser

X-Ray Metrology for Silicon Semi

Non-destructive x-ray metrology solutions for thin-films identifying substrate defects and performing front end of line control of epi films and high-k dielectrics, as well as analyzing metal films and wafer-level packaging bumps
阅读更多
Bruker
© Copyright Bruker 2025
Imprint Terms of Use Privacy Notice Cookie Notice Social Responsibility Reports