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Electronic Materials

As electronic devices shrink, electrical characterization becomes more important—and more challenging.

Electronic materials are the foundation of the devices we use daily to make our lives easier and more productive, and are a key building block for the technologies of the future. As we demand more capability from these devices—faster computing, brighter lights, smaller components—the need grows for correlated physical and electrical characterization at the nanometer scale.

Bruker provides an extensive suite of electrical characterization modes for atomic force microscopy, available on multiple platforms. In addition to classic electrical modes such as Electric Force Microscopy (EFM) and Conductive AFM (CAFM), Bruker has recently expanded the collection with the addition of Photoconductive AFM (pcAFM) and variations of TUNA and KPFM incorporating innovative PeakForce TappingTM technology.