Advances in AFM and Nanoindentation
A free workshop co-hosted by Rice University with Bruker
Explore New Advances and Research Trends [Draft]
Bruker is pleased to co-hosted a free one-day workshop on nanoscale surface characterization with Rice University on October 22.
This workshop will explore the latest advances in nanoscale characterization techniques, including AFM, AFM-IR and Nanoindentation. Through expert presentations and live demonstrations, attendees have the opportunity to gain practical insights into nanoscale property analysis, advanced nanomechanical testing methods, physical property mapping and chemical imaging.
Lunch will be provided.
The workshop is free and space is limited, so register today to secure your spot!
If you have any questions regarding the workshop, please contact Steve Ziegler at stephen.ziegler@bruker.com.
Date: October 22, 9:00AM - 4:00PM CDT
Location: Rice University
Ralph S. O’Connor Building for Engineering and Science, Rm. 510
Campanile Rd, Houston, TX 77005
Agenda [Draft]— Thursday, October 22
| Time | Topic / Action | Presenter |
| 09:00 AM | Registration | |
| 09:20 AM | Introduction | |
| 09:30 AM | Talk 1 | Presenter 1 |
| 10:30 AM | Talk 2 | Presenter 2 |
| 11:10 AM | Talk 3 | Presenter 3 |
| 12:00 PM | Lunch (provided by Bruker) | |
| 01:00 PM | Demo 1 | |
| 02:00 PM | Demo 2 | |
| 03:00 PM | Demo 3 | |
| 03:30 PM | Demo 4 | |
| 04:00 PM | End of Event |
Meet Our Experts
Ming Ye, Ph.D., Applications Scientist, Bruker
Dr. Ming brings over 20 years of extensive experience in the field of Atomic Force Microscopy (AFM) and microanalysis, currently serving as an Application Scientist within the Bruker North America team. After earning a Ph.D. from the Chinese Academy of Sciences in 2010, Dr. Ming conducted advanced postdoctoral research at the Max Planck Institute. The journey into the commercial AFM sector began in 2013 in Berlin, where Dr. Ming joined JPK Instruments AG—the predecessor to Bruker BioAFM. Prior to the current role at Bruker NA, Dr. Ming served as the Principal Scientist for Microanalysis at BASF Asia Pacific, bridging the gap between fundamental research and large-scale industrial solutions.
Radhika Laxminarayana, NRL Development Engineer, Bruker Nano Surfaces and Metrology
Radhika Laxminarayana is an Applications Development Engineer at Bruker Nano Surfaces, working on Hysitron platform systems with a focus on nanomechanics, materials characterization, and instrumentation development, supporting the advancement of testing methodologies and software capabilities for research and industrial applications.
Workshop Organizers
Tanguy Terlier
Lead Project Engineer
Rice University Shared Equipment Authority (SEA)
tanguy.terlier@rice.edu
Timothy Gilheart
Executive Director of Research Infrastructure
gilheart@rice.edu
Steve Ziegler
Sales Account Manager-Southwest
Bruker Nano Surfaces and Metrology
stephen.ziegler@bruker.com
