Brno, Czech Republic. September 4 - 9

16th Multinational Congress on Microscopy

Enrich your Microscope with Elemental Analysis.


Visit us at booth 10 to find out more and discover our new EDS Detector - the XFlash® 7.

16MCM - The 16th Multinational Congress on Microscopy

The 16th Multinational Congress of Microscopy is bringing together academia, research and business to exchange ideas, present results and share experiences. 

Bruker are excited to be exhibiting our electron microscope analyzer range, that gives electron microscopists the ability to see the elements in their samples. Technologies in the range include EDS, WDS, EBSD and micro-XRF on SEM. In particular we are excited to present our new EDS detector, the XFlash® 7.

If you would like to hear more about Bruker's technology for electron microscopes please visit our stand at booth number 10 or book an appointment at the congress or online with a Bruker Expert using the button to your right.

Book an Appointment with a Bruker Expert

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