XFlash® 7 - The New EDS Detector Series

Element Analysis

Discover Your XFlash® 7 Now! 


Energy Dispersive Spectrometry for SEM, FIB-SEM and EPMA

XFlash® 7 - The EDS Detector for Scanning Electron Microscopy 

Achieve unmatched analysis speed!

Quantify the most complex data using the most comprehensive atomic database incl. K, L, M and N lines!

Maximize your sample throughput with the best available geometric collection efficiency of the generated X-rays!


Element Analysis in Transmission Electron Microscopy on the Nanometer Scale

XFlash® 7T - The EDS Detector for TEM, STEM and T-SEM

Identify and quantify all present elements unequivocally supported by higher energy element lines!

Succeed in TEM, STEM and T-SEM with easy-to-use powerful quantification procedures based on theoretical and experimental Cliff-Lorimer factors, as well as Zeta-factor interpolation!

Map periodic structures (atoms, layers) with high stability and as comfortably as non-periodic features supported by dedicated drift correction routines!

Contact Us

Contact Information

* Please fill out the mandatory fields.

Please enter your first name
Please enter your first name
Please enter your e-mail address
Please enter your first company / institution
What best describes my current situation:
Please accept the Terms and Conditions

* Please fill out the mandatory fields.

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.