Electron Microscope Analyzers


XFlash® 7T - Seeing Nano in Color: STEM EDS in TEM and SEM

Single Atoms and Nanostructures

Get the Best Possible Results for each Specific Microscope

Unprecedented upper energy limit
Unequivocally identify and quantify all present elements
TEM-quantification models
Succeed in TEM, STEM and T-SEM with easy-to-use powerful quantification based on theoretical and experimental Cliff-Lorimer factors, as well as Zeta-factor interpolation
Stable resolution
Map periodic structures (atom, layers) with high stability and using enhanced drift correction features

Element Analysis in Transmission Electron Microscopy on the Nanometer Scale

Flexible and easy-to-use analysis software package ESPRIT with an open user interface: you see what you do.

Off-line analysis option with individual or LAN access for student or laboratory networks.

Sophisticated most seasoned quantitative energy dispersive X-ray spectroscopy (EDS) for complete data mining includes: 

  • Options for quantification steps: default suggestions for easy use, indvidual setup, detailed modification and saving/reloading of recipes
  • 3 different quantification approaches are covering all possible scenarios based on theoretical and experimental Cliff-Lorimer factors as well as Zeta-factors and the interpolation of missing Zeta-factors
  • TEM-specific high energy element lines above 40 keV available for quantification ensuring unambiguous results
  • Choice of 3 vital background models: a physical one for bulk and a physical one for thin lamellae as well as a mathematical model
  • Absorption correction included in the Cliff-Lorimer quantification already

High-resolution Element Distribution Analysis of Electron Transparent Samples in TEM, STEM and SEM (T-SEM)

  • Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
  • Maximum collection and take-off angle allow fast and highly sensitive data acquisition
  • Fast-moving stable detector stage
  • A special drift correction routine for periodic features ensures successful EDS on the nanoscale
  • Time resolved data acquisition for in-situ experiments suitable for saving a stream of changing data, f.e. at elevated temperatures
  • Automation of data acquisition and analysis processes using the scripting and API options for generation of specific analysis jobs and batch processing
  • Clean data needing no or minimal post-acquisition corrections due to avoiding mechanical and electromagnetic interference completely and avoiding or keeping to a minimum specimen tilt, absorption, shadowing and system peaks
  • Most seasoned quantification for EDS data from electron transparent specimens on the market provides thorough data mining with unambiguous results
  • Highest quality assistance and training due to long standing experience in TEM for using your system to its full power

Ultimative Results with the Latest XFlash® 7 EDS Detectors for TEM 

© Image and sample courtesy of Michael Malaki, Shamail Ahmed; Material Science center, Faculty of physics, Philipps University Marburg

EDS Analyses of Coated Li-ion Battery Cathode Particle

The capacitance retention of NCM cathode material of batteries (SSB and LIB) can be improved by coating structures. To control the performance of these nanometer-thick coatings, their elemental distribution must be known. We present a SEM-based solution of EDS analysis achieving nanometer resolution on micrometer-sized cathode particles with irregular surfaces and compare it to TEM EDS.

Fields of Application of Elemental Analysis on TEM