XFlash® 7 is the latest generation of Bruker’s EDS detectors, which provide the largest solid angle, highest throughput and highest take-off angle for X-ray collection on electron microscopes. Combined with our modular ESPRIT software, the QUANTAX EDS system can deliver the fastest, most reliable results and the best quality data for your research.
In this webinar we present the benefits of the new XFlash® 7 detector series for SEM and TEM and discuss specifics of microscope detector geometries. We also show examples of data acquisition and analyses across different fields of application.
Senior Product Manager EDS/SEM, Bruker Nano Analytics
Dr. Meiken Falke
Global Product Manager EDS/TEM, Bruker Nano Analytics
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