X-ray Diffraction (XRD)

DIFFRAC.LEPTOS

LEPTOS is a comprehensive software suite for the evaluation of  X-ray Reflectometry (XRR), High-Resolution X-ray Diffraction (HRXRD), Grazing-Incidence Small-Angle X-ray Scattering (GISAXS), and Residual Stress (RS) data.

Highlights

Fully featured Materials Research software package

X-ray reflectivity (XRR) provides detailed information on the vertical sample density profile, layer thicknesses, and interface roughness. High-resolution X-ray diffraction (HRXRD) measures the crystallographic structure of the sample. Grazing-incidence Small Angle Scattering (GISAXS) is used for evaluation of nanoparticles and porosity. Residual Stress analysis probes the strain status of bulk samples and polycrystalline coatings.

Along with conventional single-curve scans, LEPTOS enables analysis of high-resolution HRXRD and XRR reciprocal space maps, GISAXS and XRD² Stress frames, area mapping for HRXRD, XRR, and Residual Stress applications. It doesn’t matter whether data have been collected with 0-D, 1-D or 2-D detectors.
The GUI can be customized to accommodate the requirements of both scientific researchers and industrial operators.

  • Joint evaluation of multiple XRR, HRXRD, GISAXS and RS measurements
  • Advanced X-ray scattering theories and numerical methods for estimation, simulation and fitting of data in direct and reciprocal space
  • Naturally integrated processing of the 1- and 2-dimensional data sets measured by point, line and two-dimensional detectors
  • Universal sample model editor for parameterizing any type of thin film and bulk samples
  • Comprehensive and extendable material database covering all 230 crystallographic space groups
  • Area mapping tool for display and evaluation of the measurements performed over large sample areas
  • Advanced sin²ψ method for Residual Stress analysis of 1-D and 2-D data, as well as the multiple (hkl) method of evaluating the stress gradient in polycrystalline coatings

Eigenschaften

DIFFRAC.LEPTOS Modules

LEPTOS R

With LEPTOS R diffuse scattering rods and rocking curves can be fitted both as a separate curve and as a consistent set of several curves in any combination of transverse and longitudinal scans.

LEPTOS R is designed for the analysis of X-ray Reflectivity (XRR) data and off-specular Diffuse Scattering (DS) from thin layered structures. The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the R module inherits all the functionality common for the whole package.

LEPTOS R has been highly rated in several international benchmarks, including the VAMAS project A10. The structure of LEPTOS R is compliant with the newly developed international rfCIF standard for the data format of XRR data.

LEPTOS H

LEPTOS H contains an Area Mapping module that makes it possible to treat HR-XRD data taken point-by-point over a large sample area and to display mappings of sample parameters.

LEPTOS H stands for High-Resolution X-ray Diffraction and Grazing-Incidence X-ray Diffraction data analysis.

The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the H module inherits all the functionality common for the whole package.

LEPTOS S

Residual stress gradients can be calculated from multiple {hkl} measured at different grazing-incident angles. The absorption and refraction of X-rays, as well as the coating thickness, are taken into account for the calculation.

LEPTOS S is an innovative, powerful and comprehensive module for the analysis of Residual Stresses measured by 0D, 1D or 2D detectors by use of classic sin2ψ and extended XRD2 methods. The module is fully integrated in the LEPTOS suite and inherits all the functionality common for the whole package.

LEPTOS G

LEPTOS G allows the integration of 2D data into fitable 1D datasets as well as transformation of 2D data between laboratory and reciprocal space coordinates.

LEPTOS G makes an evaluation of Grazing-Incidence Small-Angle Scattering data, measured from the samples containing nanoscale particles embedded within the undersurface region or located on the surface of sample. These can be, for example, buried or surface semiconductor quantum dots and islands, porous materials, condensed powder, embedded in polymers nanoparticles, etc. The license for module G includes also R module for X-ray Reflectivity.

Spezifikationen

DIFFRAC.LEPTOS Specifications

Version The current software version is V7.10.12

Analytical methods

Dynamical Parratt’s formalism

Diversity of interfacial roughness models

Operator Method for the calculation of X-ray scattering parameters

Patented Method of EigenWaves (MEW)

Fast 2x2 and precise 4x4 Recursive Matrix Formalism

Classic and extended sin2ψ, as well as XRD2 methods

Evaluation of residual stresses from multiple {hkl}

Stress/strain gradients in thin polycrystalline coatings

Operating system

Windows 8 and 10 (32-bit or 64-bit)