Micro-XRF Spectrometers

Sedimentology & Stratigraphy with the M4 TORNADO

Why Use the M4 TORNADO for the Characterization of Sedimentary Rocks?

Bruker’s M4 TORNADO micro-XRF spectrometer provides minimally invasive, rapid spatial elemental characterization of a wide range of sedimentary materials from unconsolidated or wet sediments (lacustrine or marine) to sedimentary rocks, as cut samples or drill core.

With a spot size resolution to below 20 microns and ability to simultaneously detect major, minor and trace elements, characterization of fine features such as the chemical variation in laminated sediments is easily achieved. With full quantification capability, data may be correlated with other bulk techniques to build detailed and robust chemo-stratigraphic models.

Figure 1 - The M4 TORNADO is a benchtop micro-XRF spectrometer for the spatial elemental analysis of geological samples. 

Compositional Characterization of Laminated Sediments

Marine and lacustrine sediments commonly preserve compositional variations that are a reflection of cyclic depositional events and climate variations. The sediments may also locally record evidence for catastrophic events impacting a location, all of which are targets for scientists to better understand earth events on local, regional, and global scales. One key to unraveling these event histories is accurate and robust characterization on scales similar to those variations preserved in the samples.

The small spot size and high element resolution achieved with ease using the M4 TORNADO micro-XRF spectrometer makes the instrument ideal for characterization of finely laminated sediments. Complementary to traditional single-line scanning XRF, the M4 TORNADO provides a more comprehensive and detailed picture of vertical and lateral variations in a sedimentary core, or other samples. 

 

Figure 2 - Micro-XRF maps taken using the M4 TORNADO of drill core collected through laminated lake sediments, showing correlation and anticorrelation of elements defining cycles of deposition in the lake.

Elemental Variation in Banded Iron Formations

Banded Iron Formations (BIFs) are both records of an important part of Earth’s history and the largest source of iron ore mined worldwide. Formed when early cyanobacteria began to produce enough oxygen to react with dissolved iron in the world’s oceans causing iron oxide minerals to precipitate and be deposited on the ocean floors. Formed between ~3.8 and 1.7 billion years ago, BIFs are only preserved in a few locations worldwide but are keys to understanding processes operating in the early oceans.

Micro-XRF provides a ‘bigger picture’ of any BIF sample than can viewed based on traditional thin sections alone, while still retaining a small (<20 um) spot size and with the benefit of sensitivity to trace levels. Elemental mapping by the M4 TORNADO reveals deep levels of detail in any sample, allowing a researcher to understand the chemical complexity that may be preserved in such samples.

 

Figure 3 - elemental map of a banded iron formation sample detailing the finely laminated quartz and hematite-rich layers in the rock. 

Full Spectrum Provenance Analysis of Unconsolidated Sediment and Crushed Samples

Understanding the source of components in a sedimentary rock is a key component of studies about sedimentary processes and terrane evolution. Information such as mineral species, abundance, and grain sizes, are commonly targeted using laborious optical microscopy techniques, or through analysis by scanning electron microscope. In some cases, samples are screened for dateable minerals, especially zircon, to determine the ages of rocks forming the source materials to a sediment and also the tectonic setting of erosion and deposition.

Traditional techniques typically require extensive sample preparation, such as thin sections or polished epoxy mounts. In contrast, the M4 TORNADO micro-XRF spectrometer allows rapid screening of particulate samples to identify the presence of even a trace abundance of minerals. Elemental mapping may be conducted on non-flat samples, including scatter-mounts of particulates without the need for mounting in epoxy, polishing, or carbon coating, making quick screening simple and easy to achieve. The added benefit of micro-XRF, as an ED-XRF technique, is that an entire energy spectrum is collected simultaneously at each point, allowing comprehensive characterization of a sample and detection of minerals not expected within a sample, and a robust full sample provenance in a much-reduced period of time in a systematic manner.

 

Figure 4 - Rapid screening of a sand sample by elemental mapping via micro-XRF with the M4 TORNADO. Upper: overview image of sand sample simply scattered on double-sided carbon tape on a regular optical thin section, with no epoxy, polishing, or carbon coating. Middle: Element map of the sand sample showing the relative distributions of iron oxide and iron-sulfate coated mineral grains. Lower: Element map of the sand sample showing the relative abundances of quartz (pale blue), rutile (blue), ilmenite (purple), and Fe-rich minerals (red).

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