Highest Resolution Characterization of Thin Films and Coatings; Topography & Physical Properties
LIVE DEMONSTRATION: PEAKFORCE TUNA WITH DIMENSION XR
In this demonstration, the presenter will measure the conductivity of a thin film sample (ITO transparent conductive film) using PeakForce TUNA intermittent conductive mode and a conductive platinum silicide probe, performed on Bruker's Dimension XR AFM.
Classical methods for electrical conductivity mapping require contact mode operation and are consequently limited in resolution, repeatability, and applicability to soft or fragile samples. In contrast, PeakForce TUNA operates with the probe in intermittent contact with the sample and utilizes a high-bandwidth amplifier that enables continuous current detection, even when the tip is not in contact with the sample. This, as well as the ability to simultaneously collect topographic and mechanical property information during data acquisition, greatly increase the potential applications of conductive AFM for the study of thin films and coatings.
