On-Demand Session | 35 Minutes

Highest Resolution Characterization of Thin Films and Coatings; Topography & Physical Properties

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Submit the form for instant, full-length access to this session and related recordings from this event. In this session, Senli Guo, Ph.D. (Senior Applications Scientist, Bruker) discusses several AFM-based techniques for analyzing the properties of films and coatings . 


See real-world examples of the practical applications of different AFM modes for nanomechanical, nanoelectrical, and nanothermal property mapping.

  • Learn how and when to use different AFM modes to measure the surface topography and other physical properties of films and coatings.
  • Better understand the advantages and best uses of different PeakForce Tapping techniques.
  • See how to use PeakForce TUNA to measure the conductivity of thin films and coatings. 


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In this demonstration, the presenter will measure the conductivity of a thin film sample (ITO transparent conductive film) using PeakForce TUNA intermittent conductive mode and a conductive platinum silicide probe, performed on Bruker's Dimension XR AFM.

Classical methods for electrical conductivity mapping require contact mode operation and are consequently limited in resolution, repeatability, and applicability to soft or fragile samples. In contrast, PeakForce TUNA operates with the probe in intermittent contact with the sample and utilizes a high-bandwidth amplifier that enables continuous current detection, even when the tip is not in contact with the sample. This, as well as the ability to simultaneously collect topographic and mechanical property information during data acquisition, greatly increase the potential applications of conductive AFM for the study of thin films and coatings.