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Surface Finish Optimization for Advanced Manufacturing by Optical Profiler

Understand how the areal roughness parameter impacts part/component quality and why it drives improvement of surface finishing processes in manufacturing

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Presented by Raphaël Deltombe, Morphomeca. LAMIH (Valenciennes, France); Donald K. Cohen, Michigan Metrology, LCC; Samuel Lesko, Ph.D., Director of Technology and Applications Development, TSOM Unit, Bruker (June 13, 2020)

_{PRESENTATION HIGHLIGHTS:}

[00:05:17] Finishing Process for 3D Printed Polymer Surfaces (Samuel Lesko, Ph.D.)
[00:37:45] Substrate Surface "Spectroscopy" and the Prediction of Final Paint Appearance (Don Kohen, Ph.D.)
[01:05:23] What Texture for What Functionality & How to Characterize? (Raphaël Deltombe, Ph.D.)
[01:41:17] Live demonstration of surface finish characterization with the ContourGT-X

_{LIVE AUDIENCE Q&A:}

[00:35:37] What is the noise floor of a Bruker WLI interferometer/optical profiler?
[00:37:08] What is the scale/size distribution of the measurements of 3D printed materials?
[01:03:37] If the band is 0.0321 nm then why use a bandwidth range of 0.15 mm to 2 mm?
[01:52:06] Could the ISO 12085 based on the motif profile parameter help with studies on hot rolling and on wire with the corona effect?
[01:54:47] How much does the stamping process contribute to the surface roughness?
[01:56:57] Can we use artificial intelligence informed by historical measurements to automatically identify the right parameters or are they determined by a systematic process?