PRESENTATION HIGHLIGHTS:
PRESENTATION HIGHLIGHTS:
[00:00:40] Part 1: Using machine learning to classify and predict structural property relationships from AFM images
[00:17:21] Part 2: Artifact detection research
PRESENTATION HIGHLIGHTS:
PRESENTATION HIGHLIGHTS:
Collect and process data for machine learning with Bruker technology
PRESENTATION HIGHLIGHTS:
Presentation 1:
Presentation 2:
Presentation 3
Presentation 4
General Questions