On-Demand Session: The Fundamentals of AFM Probe Selection

       _{PRESENTATION HIGHLIGHTS:}

• [00:00:11] Overview of probe characteristics and considerations for selection

• [00:05:27] Probe selection based on AFM mode

• [00:06:25] Probe selection based on scan rate/imaging speed requirements

• [00:08:52] How to choose a probe coating

• [00:10:50] How to choose the right probe tip shape and radius

• [00:13:50] How to get probe recommendations using Bruker AFM software

• [00:15:27] Q&A
  

       _{SEE RECOMMENDED PROBES FOR:}

•  [00:00:15] Topography measurements
• [00:05:29] High resolution imaging

• [00:06:22] Measuring high aspect ratio structures (trenches and lines, TSVs)

• [00:07:48] Automated AFM critical metrology

• [00:08:49] High-speed imaging

• [00:10:49] Mechanical measurements

• [00:14:25] Nanoelectrical measurements

• [00:18:50] Magnetic characterization

• [00:19:51] Q&A
  

       _{SEE RECOMMENDED PROBES FOR:}

• [00:00:11] High-resolution imaging

• [00:02:00] Imaging cells

• [00:06:17] High-speed imaging

• [00:08:12] Mechanical mapping on soft samples

• [00:09:15] Accurate mechanical and rheological measurements with sphere probes

• [00:12:04] Q&A