QUANTAX WDS: Advancing Microanalysis Beyond the Limits of SEM EDS

On-Demand Webinar - 1 Hour

What to expect:

Energy Dispersive Spectrometry (EDS) and Wavelength Dispersive Spectrometry (WDS) are complementary techniques for X-ray microanalysis in Scanning Electron Microscopy (SEM). While EDS offers rapid elemental identification, its limitations in spectral resolution and detection sensitivity, particularly for light and trace elements, necessitate a more advanced approach.

QUANTAX WDS meets this need by delivering significantly enhanced spectral resolution (10 to 20 times greater than EDS), lower detection limits (typically 10 times better), and superior performance in light element analysis (up to 50 times higher sensitivity for Boron and Beryllium).

QUANTAX WDS is specifically optimized for high spectral resolution at low X-ray energies, allowing for high spatial resolution measurements at low accelerating voltages. As a result, it effectively resolves peak overlaps, confirms the presence or absence of elements without relying on software-based deconvolution, and quantifies elements that EDS may overlook. These capabilities expand the analytical power of SEM, enabling reliable detection of trace elements and more accurate quantification.

In this presentation, we demonstrate QUANTAX WDS unique capabilities through a range of application examples in automotive engineering, geosciences, steel production, materials research, and semiconductor technology, demonstrating its practical value for both industrial and academic research.

This webinar highlights the transformative role of WDS in modern microanalysis workflows, emphasizing its ability to overcome the inherent limitations of EDS in terms of spectral resolution and sensitivity.

Who should watch?

Researchers and lab managers from industry and academia interested in elemental analysis.

Point spectra and map (insert top right) of a semiconductor microsensor sample. EDS only detects Tantalum (and surface-adhering elements C and O). But QUANTAX WDS sees more: it also detects Si, derived from the substrate below the ~30 nm thick Ta layer.

Speakers

Dr. Michael Abratis

Sr. Application Scientist, Bruker Electron Microscope Analyzers

Stephan Boehm

Product Manager - micro-XRF on SEM and WDS, Bruker Electron Microscope Analyzers

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