Application Training

High Resolution Diffraction

This training course will show the theoretical fundamentals and data collection strategies for high resolution X-ray diffraction with the D8 family of diffractometers. The main focus is on the analysis of epitaxial thin films using the DIFFRAC.SUITE software packages including DIFFRAC.LEPTOS H.

Date:

  • August 8 - 9, 2022
  • October 31 - November 1, 2022

Time:

  • 9am-4pm CT

Further Information

Location

Language

English

Class size

Because our trainings are interactive and learner-oriented, we limit class size to a maximum of four participants. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. We reserve the right to cancel a course and will notify participants four weeks prior to the start date if the course is cancelled.

*Each participant will be provided with class materials and lunch daily.

Attendance fee

The course fee is $1,870 USD per attendee per two-day session.

Contact

For further information about the course content, please contact:

Ben Krueger
Applications Scientist, XRD

For information about price, registration, or other questions:

Melanie Swanson
Marketing Specialist

For a quotation, please contact: