Application Training

High Resolution Diffraction

This training course will show the theoretical fundamentals and data collection strategies for high resolution X-ray diffraction with the D8 family of diffractometers. The main focus is on the analysis of epitaxial thin films using the DIFFRAC.SUITE software packages including DIFFRAC.LEPTOS H.

Date:

August 23-24, 2021 (English)

Time:
9am-4pm CT

Details:

Location:

Further Information

Location

Language

English

Class size

Because our courses are interactive and learner-oriented, we limit class size to a minimum of three and a maximum of six. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis.

 

*Each participant will be provided with class materials and lunch daily.

Attendance fee

The course fee is $1,700 USD per attendee per two-day session.

Contact

For further information about the course content, please contact:

Ben Krueger
Applications Scientist, XRD

For information about price, registration, or other questions:

Caitlin Heitman
Marketing Specialist

For a quotation, please contact: