Governments around the world have restrictions in place to protect their people from illegal or dangerous goods from entering the country. Analytical measurement techniques are readily available to help inspectors determine if imports comply.
XRF is a fast, nondestructive technology for elemental analysis of restricted substances in a variety of materials. Bruker’s Elemental Analyzer portfolio includes high-throughput lab-based ED-XRF and WD-XRF, point-and-shoot handheld XRF, micro-XRF, and total reflection XRF (TXRF) spectrometers.
Micro-XRF can map the density distribution of restricted elements in materials to have a better understanding of where they reside in a product.
TXRF provides the sensitivity of ICP-OES and AAS for elemental analysis at very low concentration levels without needing external calibrations or high maintenance costs. TXRF elemental analysis is a significantly faster and “greener” method than ICP.
Portable XRF is ideal for screening any material for dangerous levels of elemental restricted substances. Objects in all forms– liquids, solids, cores, powders, creams – can be analyzed wherever they are located. It is commonly used for screening small pieces, such as electronic components, trinkets, and jewelry as well as large samples which cannot be moved to a lab, such as furniture.