Bruker
Products & Solutions Applications Services & Support News & Events About Careers
Please use at least 2 characters (you are currently using 1 character)

Languages

  • Deutsch
  • English
  • Español
  • Français
  • Italiano
  • Polski
  • Português
  • Русский
  • 中文
  • 日本語
  • 한국어

TXRF Spectrometers

Benchtop TXRF Spectrometers for Trace Element Analysis

Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.

S2 PICOFOX TXRF-Spektrometer

S2 PICOFOX

Transportable TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the ng or µg range: low operating cost, “green” technology
Read More
S4 T-STAR TXRF spectrometer

S4 T-STAR

High-volume TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the pg, ng or µg range: low operating cost, “green” technology
Read More
TXRF principle

How does TXRF work?

During total reflection X-ray fluorescence analysis an aircooled X-ray tube generates an X-ray beam, which is reduced to a narrow energy range by a multi-layer monochromator.
Read More

Live from the Lab Recordings

LftL-S4-E12-Trace-Elemental-Analysis-Teaser
June 12, 2025

S4 E12: Trace Elemental Analysis with Minimal Sample Prep

In this session, Noah, our TXRF application scientist will walk you through the core principles of TXRF, discuss differences compared to ICP techniques, and share real-world examples across industries like food safety, pharmaceuticals, and environmental testing.

Contact

Software & Manuals
Bruker Offices
Bruker
© Copyright Bruker 2025
Terms of Use Imprint Privacy Notice UKMSA Cookie Notice