Bruker
Products & Solutions Applications Services & Support News & Events About Careers
Please use at least 2 characters (you are currently using 1 character)

Languages

  • Deutsch
  • English
  • Español
  • Français
  • Italiano
  • Polski
  • Português
  • Русский
  • 中文
  • 日本語
  • 한국어

TXRF Spectrometers

Benchtop TXRF Spectrometers for Trace Element Analysis

Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.

S2 PICOFOX TXRF-Spektrometer

S2 PICOFOX

Transportable TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the ng or µg range: low operating cost, “green” technology
Read More
S4 T-STAR TXRF spectrometer

S4 T-STAR

High-volume TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the pg, ng or µg range: low operating cost, “green” technology
Read More
TXRF principle

How does TXRF work?

During total reflection X-ray fluorescence analysis an aircooled X-ray tube generates an X-ray beam, which is reduced to a narrow energy range by a multi-layer monochromator.
Read More

Contact

Software & Manuals
Bruker Offices
Bruker
© Copyright Bruker 2025
Terms of Use Imprint Privacy Notice UKMSA Cookie Notice