TXRF Spectrometers

Benchtop TXRF Spectrometers for Trace Element Analysis

Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.

S2 PICOFOX TXRF-Spektrometer

S2 PICOFOX

Transportable TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the ng or µg range: low operating cost, “green” technology

더 읽어보기

S4 T-STAR TXRF spectrometer

S4 T-STAR

High-volume TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the pg, ng or µg range: low operating cost, “green” technology

더 읽어보기

TXRF principle

How does TXRF work?

During total reflection X-ray fluorescence analysis an aircooled X-ray tube generates an X-ray beam, which is reduced to a narrow energy range by a multi-layer monochromator.

더 읽어보기

Contact Information

Expert Team

Get more information on our products and solutions

Contact an Expert

Customer Support

Do you need assistance with your Bruker instrument?

Contact Customer Support

FIRST Newsletter

Bruker's X-ray & Elemental Analysis News