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TXRF Spectrometers

Benchtop TXRF Spectrometers for Trace Element Analysis

Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.

S2 PICOFOX TXRF-Spektrometer

S2 PICOFOX

Transportable TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the ng or µg range: low operating cost, “green” technology
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S4 T-STAR TXRF spectrometer

S4 T-STAR

High-volume TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the pg, ng or µg range: low operating cost, “green” technology
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t-aero-product-teaser

T-AERO Package

TXRF spectrometer extension for in-field sampling of airborne particulate matter (PM) and direct analysis of heavy metals.
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Learn More about Total X-Ray Reflection Fluorescence Spectroscopy

TXRF principle

How does TXRF work?

During total reflection X-ray fluorescence analysis an aircooled X-ray tube generates an X-ray beam, which is reduced to a narrow energy range by a multi-layer monochromator.
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