TXRF Spectrometers

Benchtop TXRF Spectrometers for Trace Element Analysis

Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.

S2 PICOFOX total reflection X-ray fluorescence (TXRF) analysis

S2 PICOFOX

Transportable TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the ng or µg range: low operating cost, “green” technology

High Performance TXRF Spectrometer for Ultra-Trace Element Analysis

S4 T-STAR

High-volume TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the pg, ng or µg range: low operating cost, “green” technology

Contact Information

Expert Team

Get more information on our products and solutions

Contact an Expert

Customer Support

Do you need assistance with your Bruker instrument?

Contact Customer Support

FIRST Newsletter

Bruker's X-ray & Elemental Analysis News