Overcome the Limitations of Conventional EDS with the new QUANTAX FlatQUAD
The new Bruker QUANTAX FlatQUAD system, equipped with the XFlash® FlatQUAD detector, revolutionizes SEM EDS elemental analysis, making it routine and easy.
The detector’s innovative annular four-segment design, placed directly under the SEM pole-piece, maximizes X-ray collection and offers the highest take-off angles. This design is ideal for both the qualitative and quantitative characterization of challenging samples, such as:
- Beam-sensitive materials, life science and biological thin sections
- Semiconductor devices
- Battery materials (anode, cathode particles, black mass)
- Nanoparticles and FIB/TEM lamellae
- Samples with pronounced topographic features
- Samples with heavy surface charge accumulation (e.g. glass and ceramics).
Analyzing these samples often necessitates specimen preparation or the use of challenging acquisition parameters, like very low acceleration voltages and beam currents. Conventional EDS detectors, whether single or multiple large-area SDDs with an inclined geometry, are unable to gather the required signal quality for accurate and quantitative analysis under these conditions. With the QUANTAX FlatQUAD system, operators can easily handle these samples at unparalleled speed (10x – 50x faster), often even without special preparation.
Join us for an informative 30 minute session, where Bruker Nano Analytic’s experts introduce the new cutting-edge QUANTAX FlatQUAD making it the preferred choice of many SEM EDS analysts. We will:
- Review examples of Li-ion battery components as a model system to demonstrate the benefits of the unique detector design.
- Demonstrate the capabilities of the QUANTAX FlatQUAD system in detecting and mapping contaminants while maintaining the highest spatial resolution in EDS analysis.
Who Should Watch?
- Industry professionals using EDS as a fast and accurate material characterization method on a nano to mm scale
- Electron Microscopists (SEM and TEM)
- Anyone interested in qualitative and quantitative elemental analysis for materials science, life science, semiconductors, and battery materials, including nanostructured materials.
Speakers
Dr. Igor Németh
Application Scientist EDS, Bruker Nano Analytics
Andi Kaeppel
Senior Product Manager EDS / SEM, Bruker Nano Analytics
Dr. Sebastian Schmidt
Product Manager EDS / SEM, Bruker Nano Analytics
Watch this Webinar On-Demand
Please enter your details below to gain on-demand access to this webinar.