Advanced elemental analysis using QUANTAX WDS for SEM

Advanced elemental analysis using QUANTAX WDS for SEM

EDS, WDS, EBSD, Micro-XRF on SEM
This webinar took place on July 13th 2016

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Overview

Element analysis of samples using scanning electron microscopes (SEM) is widespread in materials related sciences and industries. Due to its versatility, robustness and speed, energy-dispersive X-ray spectroscopy (EDS) is the analytical method of choice for the majority of applications.

For more demanding tasks that require higher spectral resolution and better performance for light element and trace element detection beyond the limits of EDS, wavelength-dispersive X-ray spectrometry (WDS) is the ideal technique for gaining even deeper insight into a sample's composition. The XSense parallel beam WD spectrometer with grazing incidence collimating optics delivers outstanding spectral resolution and sensitivity in the low-energy range that enables the resolution of EDS peak-overlaps and enhanced trace and light element detection. The full integration into Bruker’s analytical software suite ESPRIT 2 makes combined EDS/WDS analyses an easy task and thus enables the user to exploit the strengths of both techniques with ease.

The 30-minute webinar will provide an overview of the QUANTAX WDS system and will particularly focus on the capabilities of the XSense WD spectrometer, the intuitive ease-of-use of the system, and the method coupling of EDS and WDS. The webinar will be rounded off by a 15-minute Q&A session where our experts will answer your questions.

Why should you attend?

  • Expand your knowledge in WDS analysis
  • Learn more about options to complement EDS and to extend the analytical capabilities of your SEM with the QUANTAX WDS system
  • Discuss your own applications with experts

Speaker

Dr. Joerg Silbermann
Product Manager WDS, Bruker Nano Analytics
Dr. Michael Abratis
Sr. Applications Scientist, Bruker Nano Analytics