Advancing Feature Analysis and Spectrum Imaging in Scanning Electron Microscopy

Developments in energy dispersive X-ray spectrometry (EDS) on scanning electron microscopes (SEM) have broadened the range of possible analyses. This one-hour webinar will discuss advanced analysis options provided by automated feature analysis which combines morphological characterization with chemical classification – which is particularly important for geoscience, mineralogy and mining.

Our webinar will focus on:

• Detection of features of interest and their morphological analysis
• Automated spectra acquisition of features
• Chemical classification based on their composition
• Retrieval of areas of specific interest for further analysis
• Advanced analysis options by spectrum imaging techniques
• Analysis with low electron beam energy (HV<7 kV)
• Element analysis of structures at the sub-µm scale, in situ within large samples

The discussion will cover several applications including mining and mineral samples:

• Mineral classification
• Quantitative mineralogy
• Ore characterization

A Q&A session will round off the webinar.

• Expand your knowledge in EDS analysis
• Learn more about advanced feature analysis and options to extend the analytical capabilities of your SEM
• Discuss your own applications with experts