Analysis of 3D EBSD data sets using ESPRIT QUBE

Analysis of 3D EBSD data sets using ESPRIT QUBE

EDS, WDS, EBSD, Micro-XRF on SEM
This webinar took place on June 16th 2016

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Overview

3D EBSD is a destructive tomographic method. It comprises a repeated sectioning and subsequent crystallographic surface characterization by Electron Backscatter Diffraction (EBSD). Typically, an integrated in-situ sectioning technique is applied, such as an SEM based focused ion beam (FIB), to generate accurately spaced serial sections. Alternatively, 3D data sets can be acquired using conventional metallography techniques and a standard SEM.

Basic voxel datasets, as directly generated by the 3D EBSD technique, are very useful for a number of microstructure characterizations, which are less accessible or incomplete in 2D EBSD. Good examples are grain morphology and crystal plasticity parameters. However, data set sizes in 3D EBSD scale by the additional dimension. Furthermore, 3D EBSD tends to suffer more from drift phenomena than classical 2D EBSD for various reasons.

This webinar will demonstrate how to analyze 3D EBSD data sets with the new ESPRIT QUBE software. You will learn how to get started and how to use its features. The discussion will include topics such as data filtering, subsets, geometrically necessary dislocation densities as well as the synergy that arises from different data set types acquired on the very same microstructure volume. It will be rounded off by a 15-minute Q&A session.

Who should attend?

  • FIB/SEM microscopists interested in advanced analytical techniques for material characterization
  • EBSD users interested in 3D EBSD
  • Researchers interested in EBSD studies

Speakers

Dr. Laurie Palasse
Senior Application Scientist EBSD, Bruker Nano Analytics
Peter Konijnenberg
Senior Scientist, Max-Planck-Institute for Iron Research, Düsseldorf