Combining XRD and TXRF for Analysis of Pharmaceutical Materials

Combining XRD and TXRF for Analysis of Pharmaceutical Materials

A Double Dose
This webinar took place on March 13th 2014

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Overview

X-ray diffraction (XRD) and total reflection X-ray fluorescence (TXRF) are two powerful, non-destructive techniques used in pharmaceutical analysis. When combined, these complementary methods provide a wealth of structural and compositional information.

XRD provides information regarding the atomic or molecular arrangment in crystalline materials. This technique is frequently used for positive phase identification and to distinguish between various polymorphs. Additionally, XRD allows for the quantification of phases in formulations and calculation of amorphous/crystalline content.

TXRF approaches sample analysis from an elemental perspective and is capable of qualitative and quantitative multi-elemental analysis down to the ppb range. By utilizing a shallow angle X-ray geometry, the S2 PICOFOX allows for the analysis of trace impurities, even on small sample volumes in an easy-to-use platform with minimal sample preparation.

Join us for this 45-minute complimentary webinar exploring several case studies using the D2 PHASER (XRD) and S2 PICOFOX (TXRF) benchtop instruments. Dr. Nathan Henderson, Applications Scientist, and Michael Beauchaine, Business Development Manager, will provide an overview of each technology and discuss the benefits of combining these analytical techniques for the rapid analysis of pharmaceuticals.

Speakers

Dr. Nathan Henderson
XRD Applications Scientist Bruker AXS Inc. Madison, WI
Mike Beauchaine
Business Development Manager XRFi - Americas Bruker AXS Inc. Madison, WI