Forensics Analysis with X-ray Diffraction and X-ray Fluorescence

Forensics Analysis with X-ray Diffraction and X-ray Fluorescence

This webinar took place on April 16th 2013

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Overview

Join Bruker scientists Nathan Henderson and Michael Beauchaine in this 1-hour webinar as they discuss XRD, TXRF and micro-XRF applications relating to forensics analysis: gunshot residue, toxicology, paint chips and origin determination, pharmaceuticals, fraudulent gemstones and banknotes, and identification of small particles.

Speakers

Dr. Nathan Henderson
XRD Applications Scientist Bruker AXS Inc. Madison, WI
Mike Beauchaine
Business Development Manager XRFi - Americas Bruker AXS Inc. Madison, WI