Good Diffraction Practice

Good Diffraction Practice Series

This webinar took place on June 27th 2013

Register to download slides & media

Webinar series part IX: LYNXEYE XE - Combining 1D Speed with 0D Background

Join Sr. Applications Scientist Holger Cordes for a 45-minute overview of the new LYNXEYE XE 1D energy-discriminating detector. Holger will present XRD application examples, using different sample types, illustrating how the LYNXEYE XE can help you better characterize your material samples.

Watch Recording

Download Slides


Webinar series part VIII: Innovative 2D XRD Applications in Materials Science

In this 1-hour educational webinar, Jon Giencke gives you an overview of 2D X-ray diffraction geometry and present-day applications that highlight XRD2's unique capabilities. Application examples include crystallite size by gamma-profiling, characterization of ultra-thin epitaxial films and superlattices, miscut angle determination of single-crystal substrates, and retained Austenite analysis with 2D XRD.

Watch Recording

Download Slides


Webinar series part VII: In-Plane Grazing Incidence Diffraction

In addition to providing in-plane structural information such as phase ID, crystallite size, lattice parameters, texture, and epitaxial relationship to substrate, IPGID is a very surface-sensitive technique, which makes it well suited for looking at ultra-thin films. This 1-hour webinar covers an introduction to IPGID, application examples, and configurations and techniques for collecting the best data.

Watch Recording

Download Slides


Webinar series part VI: Texture Analysis with MULTEX

In this 1-hour webinar, join Dr. Kurt Helming, expert in crystallographic texture and author of MULTEX texture analysis software, as he introduces texture analysis concepts, explains how to optimize texture measurements, describes the calculation of pole figures and orientation distribution functions, covers the Component method, and presents application examples.

Watch Recording

Download Slides


Webinar series part V: Reciprocal Space Mapping

See for yourself how to apply HRXRD to acquire reciprocal space maps (RSMs) and extract information about the structural properties of your epitaxial or layered materials. The presenters discuss 1D and 2D X-ray detectors that permit mapping of large areas of reciprocal space in a very short time. Numerous examples help you learn how to interpret RSMs.

Watch Recording

Download Slides


Webinar series part IV: High-Resolution X-ray Diffractometry

This one-hour educational webinar teaches tips and tricks for getting the best possible high-resolution X-ray diffraction (HRXRD) data from your epitaxially grown thin film and semiconductor samples.

Watch Recording

Download Slides


Webinar series part III: Powder XRD Instrumentation and Data Quality

Join Dr. Lutz Bruegemann as he explains important aspects of X-ray powder diffraction workflow: from mechanical setup of the goniometer to data collection and evaluation of data quality. 

Watch Recording

Download Slides


Webinar series part II: Two-Dimensional XRD

X-ray diffraction analysis with a two-dimensional detector is fast and accurate for many applications because a 2-D pattern covers a large solid ange. This webinar presents the geometry, fundamental equations and data collection strategy for phase ID, stress measurement and texture analysis. 

Watch Recording

Download Slides


Webinar series part I: X-ray Reflectomety

X-ray reflectometry (XRR) can be used to quantitatively analyze coatings of single or multiple layers for thickness, density and roughness. Discover tips and tricks for getting the best possible data for XRR from your layered sample and achieving Angstrom-level resolution. 

Watch Recording

Download Slides