Introducing XFlash® 6
In April 2011 Bruker released the latest generation of cutting edge silicon drift detectors (SDD) for energy-dispersive X-ray spectrometry on electron microscopes.
The new XFlash® 6 series features outstanding solid angle, throughput and energy resolution that set it apart from any other SDD technology for EDS on scanning (SEM) and transmission electron microscopes (S/TEM).
This webinar will discuss the benefits of the detectors' improved performance parameters in the everyday use of an energy-dispersive X-ray spectrometer. Spectrometry on SEM and S/TEM – including sensitive aberration corrected instruments – will be examined. Additionally various application examples will be presented.
Who should attend?
- Researchers working in electron microscopy labs
- Engineering and natural sciences lecturers and students
- EDS users interested in new trends in the field