Introducing XFlash® 6

Introducing XFlash® 6

The New EDS Detector Series for SEM and TEM
This webinar took place on June 13th 2012

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In April 2011 Bruker released the latest generation of cutting edge silicon drift detectors (SDD) for energy-dispersive X-ray spectrometry on electron microscopes.

The new XFlash® 6 series features outstanding solid angle, throughput and energy resolution that set it apart from any other SDD technology for EDS on scanning (SEM) and transmission electron microscopes (S/TEM).

This webinar will discuss the benefits of the detectors' improved performance parameters in the everyday use of an energy-dispersive X-ray spectrometer. Spectrometry on SEM and S/TEM – including sensitive aberration corrected instruments – will be examined. Additionally various application examples will be presented. 

Who should attend?

  • Researchers working in electron microscopy labs
  • Engineering and natural sciences lecturers and students
  • EDS users interested in new trends in the field