Perfect Powder Diffraction Data Automatically: Dynamic Beam Optimization

Perfect Powder Diffraction Data Automatically: Dynamic Beam Optimization

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This webinar took place on May 19th 2020

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Parasitic scattering, such as air, instrument, and sample support scattering, are common contributions to X-ray powder diffraction data. The consequence is not simply an unpleasant looking powder diffraction pattern, but a significant reduction in sensitivity in terms of lower limits of detection and quantification. The distinction between instrument scattering, small angle X-ray scattering, and scattering of amorphous content can become very difficult, if not impossible.

Join us for this special 30-minute webinar, as we show you how to acquire powder diffraction patterns virtually free of parasitic scattering, thanks to the "Dynamic Beam Optimization" feature available for all members of Bruker's D8 diffractometer family.

Register now for the session that best meets your schedule.

If you cannot attend, feel free to register anyway, and we will send you a link to the recording to watch at your convenience.


Dr. Christina Drathen
Product Manager XRD, Bruker AXS
Dr. Arnt Kern
Head of Product Management XRD, Bruker AXS